Characterization of Si-TaSi2in situcomposites by synchrotron white beam topography
نویسندگان
چکیده
منابع مشابه
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ژورنال
عنوان ژورنال: Acta Crystallographica Section A Foundations of Crystallography
سال: 1993
ISSN: 0108-7673
DOI: 10.1107/s0108767378089710